benchmarks evals
Two Quantum Registers Measured Each Other's Decay
Error Per Circuit Layer estimates aggregate performance from the overlap of identical random circuits without simulating ideal outputs.
Summary
Error Per Circuit Layer estimates aggregate performance from the overlap of identical random circuits without simulating ideal outputs.
EPCL runs the same random circuit on two disjoint registers and fits how their output-state overlap falls with depth. That avoids classical simulation, recovery to a known state and restriction to Clifford or other structured gate sets. Simulations recovered the expected polarization under stochastic noise while showing that coherent errors may need twirling or randomized compiling; IBM hardware experiments showed clear decay on 8- and 16-qubit implementations. The method measures an effective layer quantity only under the paper's stated assumptions.
Why it matters
Error Per Circuit Layer estimates aggregate performance from the overlap of identical random circuits without simulating ideal outputs.
Limits and context
- The method measures an effective layer quantity only under the paper's stated assumptions.
Key claims
Error Per Circuit Layer estimates aggregate performance from the overlap of identical random circuits without simulating ideal outputs.
Qualification: The method measures an effective layer quantity only under the paper's stated assumptions.
Evidence: source-2026-09-04-011
Sources
- arXiv preprint 2609.04132arXiv · primary research
Corrections
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