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Ten Nanometers Barely Moved the Nanobeam's Answer
SEM-informed digital twins separated tolerable fabrication bias from larger optomechanical errors.
Published Updated Story ID: mp-2026-08-03-018
Summary
SEM-informed digital twins separated tolerable fabrication bias from larger optomechanical errors.
The variability-aware framework combined microscopy-derived dimensions with finite-element models. Systematic deviations of plus or minus ten nanometers had minor effects, while larger offsets more strongly altered optical and mechanical resonances.
Why it matters
SEM-informed digital twins separated tolerable fabrication bias from larger optomechanical errors.
Limits and context
No additional limitation was separately recorded.
Key claims
SEM-informed digital twins separated tolerable fabrication bias from larger optomechanical errors.
Evidence: source-2026-08-03-020
Sources
- Journal of Physics D: variability-aware optomechanical nanobeamsIOP Publishing · secondary reporting
Corrections
No corrections have been recorded for this story.