safety security
The Package Could Feel a Nanometer Being Removed
A proposed optical sensor turns microscopic delayering or drilling into a measurable sideways shift in reflected light.
Summary
A proposed optical sensor turns microscopic delayering or drilling into a measurable sideways shift in reflected light.
The design couples a reflected beam into a high-index sensing layer through frustrated total internal reflection. Numerical simulations show an approximately linear response below 250 nanometers of layer thickness and 5.3 nanometers of beam displacement for each nanometer removed—nearly three times the modeled response of a conventional structure. Drilling depth and width also produce monotonic changes. This is a simulated co-packaged tamper-sensor proposal, not fabricated security hardware or a field test.
Why it matters
A proposed optical sensor turns microscopic delayering or drilling into a measurable sideways shift in reflected light.
Limits and context
- This is a simulated co-packaged tamper-sensor proposal, not fabricated security hardware or a field test.
Key claims
A proposed optical sensor turns microscopic delayering or drilling into a measurable sideways shift in reflected light.
Qualification: This is a simulated co-packaged tamper-sensor proposal, not fabricated security hardware or a field test.
Evidence: source-2026-08-13-006
Sources
- arXiv preprint 2608.12243arXiv · primary research
Corrections
No corrections have been recorded for this story.