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The Microscope's Fast Scan Lost Signal Sideways
At microsecond dwell times, finite scan-coil response smeared 4D-STEM measurements along the fast direction.
Summary
At microsecond dwell times, finite scan-coil response smeared 4D-STEM measurements along the fast direction.
Direct probe imaging and sub-frame diffraction analysis found a settling time of several tens of microseconds, long enough to matter as detectors move toward microsecond dwell. A phase-correlation alignment procedure estimated and corrected the intra-dwell smear, restoring signal across spatial frequencies with the largest gains at the larger scan steps used for low-dose biological imaging. Because the correction operates on existing data, it requires no microscope modification; its reported performance still depends on the tested scan conditions.
Why it matters
At microsecond dwell times, finite scan-coil response smeared 4D-STEM measurements along the fast direction.
Limits and context
No additional limitation was separately recorded.
Key claims
At microsecond dwell times, finite scan-coil response smeared 4D-STEM measurements along the fast direction.
Evidence: source-2026-08-16-011
Sources
- arXiv preprint 2608.13106arXiv · primary research
Corrections
No corrections have been recorded for this story.